Imagine being part of a team that is fundamentally changing the way people communicate, collaborate, watch TV, and explore the universe through the internet. Utilizing Nokia’s uniquely differentiated technology, we have created a Digital Optical Networking system with higher speed, more capacity, and greater scalability than ever before. Imagine a world with unlimited bandwidth. The network of tomorrow will allow for content and creativity limited only by the imaginations of its users.
If this is something that interests you, come take a look at a team that is achieving exactly that, where an idea today can be set in motion tomorrow. Nokia Optical Module Group (OMG) is looking for an individual to engage in product test development. The individual is responsible for SiGe ASIC and high‑speed device characterization in both the production phase and the development phase. Come take a look at Nokia!
Responsibilities- Design test plans and algorithms for performance validation of SiGe ASIC, drivers, TIAs, and mixed signal circuits (SerDes, DACs, ADCs), etc
- Perform RF, mm-wave, analog probing and characterization, including manual and automated RF probing using high end equipment like VNA, oscilloscopes, etc
- Debug complex high‑speed semiconductor circuits and test setups, identifying root causes across electrical, RF, thermal, and software domains
- Compare measured device performance with simulation results (e.g., Cadence, SPICE, EM, behavioral models) to validate design intent, identify discrepancies, and drive corrective actions
- Develop, implement, and document bench hardware and software supporting new high‑speed device characterization
- Execute test station qualification work, including Gage R&R and statistical process control (SPC)
- Produce thorough documentation of all test solutions and communicate effectively with cross‑functional teams
- Track schedules and milestones for test development projects
- Bachelor's degree with 5+ years of applicable experience OR Master's degree in Electrical Engineering, Applied Physics, or equivalent with a minimum of 3 years of applicable graduate-level and/or industrial experience in test high speed characterization.
- Hands‑on experience with advanced analog and mixed signal semiconductor characterization
- Experience with Vector Network Analyzers (PNA) for broadband S-parameter and linearity measurements, real time oscilloscopes for high speed signal integrity and eye diagram analysis, and noise figure analyzers for gain and low noise performance evaluation
- Fundamental understanding of “high speed transistor level” topologies for drivers, TIAs, analog front end circuits, serializers/deserializers, and mixed signal building blocks
- Familiarity with programing languages such as VB.NET, Python, Matlab, C, C++, or similar languages for automation of instrument control and data acquisition
- Ability to build, maintain, and troubleshoot complex test hardware and software in a cross‑functional environment
- Experience with production‑level test environments (Gage R&R, SPC, tool qualification) is a plus
- Experience with database tools such as JMP, SQL is a plus
- Attention to detail and willingness to produce detailed documentation
- Ability to work effectively within a team environment, with clear and concise communication inside and outside the test team
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